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X-ray absorption spectroscopy study of annealing process on Sr1-xLaxCuO2 electron-doped cuprate thin films

Cornell Affiliated Author(s)

Author

A. Galdi
P. Orgiani
C. Sacco
B. Gobaut
P. Torelli
C. Aruta
N.B. Brookes
M. Minola
J.W. Harter
K.M. Shen
D.G. Schlom
L. Maritato

Abstract

The superconducting properties of Sr1-xLaxCuO2 thin films are strongly affected by sample preparation procedures, including the annealing step, which are not always well controlled. We have studied the evolution of Cu L2,3 and O K edge x-ray absorption spectra (XAS) of Sr1-xLaxCuO2 thin films as a function of reducing annealing, both qualitatively and quantitatively. By using linearly polarized radiation, we are able to identify the signatures of the presence of apical oxygen in the as-grown sample and its gradual removal as a function of duration of 350 °C Ar annealing performed on the same sample. Even though the as-grown sample appears to be hole doped, we cannot identify the signature of the Zhang-Rice singlet in the O K XAS, and it is extremely unlikely that the interstitial excess oxygen can give rise to a superconducting or even a metallic ground state. XAS and x-ray linear dichroism analyses are, therefore, shown to be valuable tools to improving the control over the annealing process of electron doped superconductors. © 2018 Author(s).

Date Published

Journal

Journal of Applied Physics

Volume

123

Issue

12

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85044403808&doi=10.1063%2f1.5021559&partnerID=40&md5=30eb83338ece27145f86864e78c647d8

DOI

10.1063/1.5021559

Group (Lab)

Kyle Shen Group

Funding Source

DMR-1719875
ECCS-15420819
1719875
DMR-1610781

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