Compressed sensing, sparsity, and the reliability of tomographic reconstructions
Date Published
Journal
Microscopy and Microanalysis
Volume
20
Issue
3
Number of Pages
796-797,
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84927919274&doi=10.1017%2fS1431927614005704&partnerID=40&md5=37e425c982275e3748481fba8a9ca9d0
DOI
10.1017/S1431927614005704
Research Area
Group (Lab)
Veit Elser Group