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Determination of crystallographic intensities from sparse data

Cornell Affiliated Author(s)

Author

K. Ayyer
H.T. Philipp
M.W. Tate
J.L. Wierman
V. Elser
Sol Gruner

Abstract

X-ray serial microcrystallography involves the collection and merging of frames of diffraction data from randomly oriented protein microcrystals. The number of diffracted X-rays in each frame is limited by radiation damage, and this number decreases with crystal size. The data in the frame are said to be sparse if too few X-rays are collected to determine the orientation of the microcrystal. It is commonly assumed that sparse crystal diffraction frames cannot be merged, thereby setting a lower limit to the size of microcrystals that may be merged with a given source fluence. The EMC algorithm [Loh & Elser (2009), Phys. Rev. E, 80, 026705] has previously been applied to reconstruct structures from sparse noncrystalline data of objects with unknown orientations [Philipp et al. (2012), Opt. Express, 20, 13129-13137; Ayyer et al. (2014), Opt. Express, 22, 2403-2413]. Here, it is shown that sparse data which cannot be oriented on a per-frame basis can be used effectively as crystallographic data. As a proof-of-principle, reconstruction of the three-dimensional diffraction intensity using sparse data frames from a 1.35 - kDa molecule crystal is demonstrated. The results suggest that serial microcrystallography is, in principle, not limited by the fluence of the X-ray source, and collection of complete data sets should be feasible at, for instance, storage-ring X-ray sources. © 2015.

Date Published

Journal

IUCrJ

Volume

2

Number of Pages

29-34,

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84937432555&doi=10.1107%2fS2052252514022313&partnerID=40&md5=8bc95a8913f59ec957cf98eae1f929df

DOI

10.1107/S2052252514022313

Group (Lab)

Sol M. Gruner Group
Veit Elser Group

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