Atomic imaging across strain boundaries in bilayer graphene with ADF-STEM and DF-TEM
Date Published
Journal
Microscopy and Microanalysis
Volume
20
Issue
3
Number of Pages
1058-1059,
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84927915747&doi=10.1017%2fS1431927614007016&partnerID=40&md5=d0a4df60a8b692841bd59c1968ed75ea
DOI
10.1017/S1431927614007016
Group (Lab)
Paul McEuen Group