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Structure-dependent Fano resonances in the infrared spectra of phonons in few-layer graphene

Cornell Affiliated Author(s)

Author

Z. Li
C.H. Lui
E. Cappelluti
L. Benfatto
K.F. Mak
G.L. Carr
J. Shan
T.F. Heinz

Abstract

The in-plane optical phonons around 200 meV in few-layer graphene are investigated utilizing infrared absorption spectroscopy. The phonon spectra exhibit unusual asymmetric features characteristic of Fano resonances, which depend critically on the layer thickness and stacking order of the sample. The phonon intensities in samples with rhombohedral (ABC) stacking are significantly higher than those with Bernal (AB) stacking. These observations reflect the strong coupling between phonons and interband electronic transitions in these systems and the distinctive variation in the joint density of electronic states in samples of differing thickness and stacking order. © 2012 American Physical Society.

Date Published

Journal

Physical Review Letters

Volume

108

Issue

15

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84859795611&doi=10.1103%2fPhysRevLett.108.156801&partnerID=40&md5=302163cf8a77380de4ac2bd3e58ca4af

DOI

10.1103/PhysRevLett.108.156801

Group (Lab)

Jie Shan Group
Kin Fai Mak Group

Funding Source

0641523
0907477
1106225
251904

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