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Measurement-induced criticality in random quantum circuits

Cornell Affiliated Author(s)

Author

Chao-Ming Jian
Yi-Zhuang You
Romain Vasseur
Andreas Ludwig

Abstract

We investigate the critical behavior of the entanglement transition induced by projective measurements in (Haar) random unitary quantum circuits. Using a replica approach, we map the calculation of the entanglement entropies in such circuits onto a two-dimensional statistical-mechanics model. In this language, the area-to volume-law entanglement transition can be interpreted as an ordering transition in the statistical-mechanics model. We derive the general scaling properties of the entanglement entropies and mutual information near the transition using conformal invariance. We analyze in detail the limit of infinite on-site Hilbert space dimension in which the statistical-mechanics model maps onto percolation. In particular, we compute the exact value of the universal coefficient of the logarithm of subsystem size in the nth Rényi entropies for n≥1 in this limit using relatively recent results for the conformal field theory describing the critical theory of two-dimensional (2D) percolation, and we discuss how to access the generic transition at finite on-site Hilbert space dimension from this limit, which is in a universality class different from 2D percolation. We also comment on the relation to the entanglement transition in random tensor networks, studied previously in Vasseur et al. [Phys. Rev. B 100, 134203 (2019)10.1103/PhysRevB.100.134203]. © 2020 American Physical Society.

Date Published

Journal

Physical Review B

Volume

101

Issue

10

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85083279039&doi=10.1103%2fPhysRevB.101.104302&partnerID=40&md5=44077afc32d4e4e60d272885bad4bbba

DOI

10.1103/PhysRevB.101.104302

Group (Lab)

Chao-Ming Jian Group

Funding Source

DMR-1309667
PHY-1748958
1309667
1748958
GBMF4304
DE-SC0019168

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